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May. 19, 2014 :: EVENT
May. 20, 2014 :: EVENT
Jun. 3, 2014 :: EVENT

Jun 8 2004 Automatic Wafer Alignment available on Cascade Microtech Probe Stations

Cascade Microtech, Inc., announces a fast and easy way to align wafers and RF calibration substrates with Nucleus VisionTM 3.0 Software. Nucleus Vision 3.0 Software eliminates die-stepping errors when using small pads and increases good test data collection. These automation tools enable faster test set up and throughput and thus more accurate data collection that gets products to market faster. [View more]

Mar 4 2004 Cascade Microtech, Inc. files registration statement with the SEC for an Initial Public Offering

Cascade Microtech, Inc. announced today that it has filed a registration statement for the proposed initial public offering of its common stock with the Securities and Exchange Commission. [View more]

Sep 11 2003 Cascade Microtech opens regional office in Singapore

Cascade Microtech, Inc., the industry leader in high-frequency and parametric on-wafer test solutions, announced today the opening of a new office in Singapore. Cascade Microtech Singapore is responsible for direct sales, service, and support of products for Cascade’s Engineering Product Division (EPD) in Singapore and Malaysia. [View more]

Jul 16 2003 Cascade Microtech announces a new high performance 300mm Thermal Probe Station

Cascade Microtech, Inc., announces a series of 300mm semiautomatic and manual S300 Probing Stations that utilize the ERS AirCool + high performance thermal system. The new stations are available with an integrated AirCool + chuck (–55 to 200°C range) or AirCool + chuck (0 to 300°C range). [View more]

Jul 16 2003 Cascade Microtech Announces a Major Upgrade to the Best-Selling Summit Series Analytical Wafer Probe Station

Cascade Microtech, Inc., announces a new series of 200mm semiautomatic and manual Summit Probe Stations. The Summit B series is a major upgrade to Cascade’s existing Summit 11000 and 12000 series which are the industries’ best-selling analytical probe stations. The “B” series provide enhanced upgradability, new probing capability, and improved usability. [View more]

Jul 16 2003 Cascade Microtech Announces Production Availability of Consumer RF Pyramid Probe® Cards for Functional Manufacturing Wafer Test

Cascade Microtech, Inc., a leading supplier of probes, test stations and accessories for semiconductor wafer-testing, announced today the production availability of its family of high-performance, fine-pitch Consumer RF Pyramid Probe Cards for in-line manufacturing. Consumer RF semiconductors are used in many familiar applications such as cell phones, WiFi, Blue-tooth, and wireless local-area networks. [View more]

Jul 16 2003 Cascade Microtech Announces Production Availability of DC Parametric Pyramid Probe Cards to Enable More Die per Wafer

Cascade Microtech, Inc., a leading supplier of probes, test stations and accessories for semiconductor wafer-testing, announced today the production availability of its high-performance, fine-pitch DC Parametric Pyramid Probe cards. [View more]

Jun 10 2003 Cascade Microtech introduces a new series of 4-port calibration standards for use to 50 GHz

Cascade Microtech, Inc., introduces a dedicated family of calibration standards for dual high frequency probes. The initial introduction is for GSGSG probe configurations with pitch between 100-250 µm. [View more]

Jun 10 2003 Cascade Microtech announces value-added reseller agreement with STAr Technologies

Cascade Microtech, Inc., a leading manufacturer of DC and RF wafer probes and probe stations for laboratory-grade parametric testing of semiconductor devices announced today that is has signed a Value-Added Reseller (VAR) agreement with STAr Technologies, Inc., a leading supplier of parametric test and measurement solutions for the semiconductor industry. This agreement will enable STAr Technologies’ Virgo-DC/RF probe cards to provide the world’s first precision single-pass DC and RF parametric test capability, thus enabling precision DC and RF parametric test with a single set of tester and probe station to reduce the total cost of test for advanced telecommunication devices. [View more]

Jun 10 2003 Wavevue Measurement Studio™ now compatible with Agilent Technologies' IC-CAP device modeling software

Cascade Microtech and Microvue announce an integrated, on-wafer device characterization and modeling solution that is compatible with Agilent Technologies’ IC-CAP modeling software. This solution will help increase lab productivity, reduce cost of test, improve asset utilization and improve return-on-investment on software tools. [View more]

Jun 10 2003 Cascade Microtech announces a next-generation integrated on-wafer device characterization solution to 110 GHz

Cascade Microtech, Inc., the worldwide leader in providing high frequency and parametric on-wafer test solutions, announces a fully integrated on-wafer device characterization solution that provides measurement accuracy and high performance for characterizing semiconductor devices to 110 GHz. This solution enables high-precision measurements up to 110 GHz by combining the new Agilent N5250A 110 GHz PNA series network analyzer with Cascade’s industry leading Summit series of analytical probing systems. [View more]

Jun 10 2003 Cascade Microtech and Microvue announce new IV and CV modules for Wavevue Measurement Studio Software for On-Wafer Test

Cascade Microtech and Microvue announce two new measurement modules for Wavevue Measurement Studio Software, IV and CV, which together with the existing RF, DC and Wafer Modules enables the complete characterization of on-wafer devices. Wavevue is an integral part of a complete Cascade Microtech test system solution for on-wafer device characterization which includes a probe station, probes, positioners, control software, and calibration standards. Wavevue Measurement Studio software integrates all the tasks of calibration, measurement, data collection, data archiving, analysis, comprehensive reporting and export of data into one easy-to-use package. [View more]

Jun 10 2003 Cascade Microtech expands Infinity Probe® series to 110 GHz

Cascade Microtech, Inc., the worldwide leader in providing high frequency and parametric on-wafer test solutions, announces the expansion of the Infinity Probe series to 110 GHz. The Infinity Probe is the first characterization probe that offers both high-frequency performance and low, stable contact resistance on aluminum pads (typically <0.05 Ohms). The contact area of the probe tips is approximately 12 microns x 12 microns, allowing probing of pads that are less than 50 um x 50 um in size. [View more]

Please vist our Press Releases and Current Events pages for more information.

Media Contact:
Laurie Winton
Sr. Marketing Communications Manager
Cascade Microtech, Inc.
(503) 601-1934