DC Parametric Probes
DC Parametric
Cascade Microtech 的 DC 探针实现了针对先进晶圆上工艺、器件特性描述和可靠性测试的高准确度测量。我们的探针提供了出色的过热防护和隔离功能，旨在消除非同轴和标准同轴探针的性能局限性。
DCP-HTR 探针座
The DCP-HTR probe holder delivers fA-level measurement capability from -65°C to 300°C for state-of-the-art reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles. [查看更多]
