Elite 300 探针台平台
300mm
300mm 晶圆探测的下一步
Elite 300 在 300mm 探测中设立了新标准。Elite 300 在 45nm 及以下工艺节点上与 ITRS 发展蓝图保持同步,它克服了由于器件复杂度的增加、焊盘尺寸的缩小以及电压的降低所带来的测量难题。Elite 300 在整个温度范围内提供了前所未有的步进准确度和晶圆平面度。另外,它还提供了当今世界上噪声最低的“安静”环境,并确保了低泄漏、低电容测量。
| Problems Solved: Accurate Measurements in Complex Environments | |||||
|---|---|---|---|---|---|
| Challenge | Advanced Stage | Thermal System | Pureline/ MicroChamber | Rigid Architecture | Automation |
| Small-Pad Probing | |||||
| Thermal Measurements | |||||
| Low-Noise Measurements | |||||
| Multi-Site Testing | |||||
| Internal-Node Probing | |||||
| Which Station is Right for My Application? | ||||
|---|---|---|---|---|
| Application | Elite 300/AP | Elite 300/M | Elite 300/S | |
| Parametric | Gm,Vth | |||
| Ig, Id off | ||||
| Cox, C-V | ||||
| 1/f | ||||
| RF | Gain, Power | |||
| NF, NP | ||||
| mmW | ||||
| multi-port | ||||
| WLR | EM | |||
| TDDB | ||||
| NBTI | ||||
| HCI | ||||
| FA/DD | Internal node | |||
| EM | ||||
| Laser | ||||
| Sub-micron | ||||

