PRF50 RF/DC parametric Pyramid Probe card is the higher-performance, lower-cost alternative to existing industry solutions. Designed to enable the accurate monitoring of 65nm and 45nm parametric test structures, the PRF50 is compatible with both the Agilent 4070/4080 Series and Keithley S600 Series. Cascade Microtech’s innovative Pyramid Plus manufacturing process ensures a substantially lower cost of ownership, while delivering superior RF signal integrity and faster DC settling time - all in a single solution. PRF50 probe cards will ensure your success in applications such as final process development, DC-only and RF/DC parametric volume production (in-line and end-of-line), and Wafer Acceptance Testing (WAT).

PRF50 RF/DC Parametric Pyramid Probe Cards
Features	PRF50 Probe Card
Guarded traces provide outstanding measurement fidelity with low leakage (1fA/V), enabling faster settling times while reducing unwanted crosstalk effects. Small pad probing down to 30?m x 30?m Low maintenance and permanent probe tip placement improve test cell uptime, reducing the cost of ownership.	PRF50 Datasheet