PDC50 DC parametric Pyramid probe cards are the high performance, low cost alternative to the existing solutions. The PDC50 is compatible with both Agilent 4070/4080 Series and Keithly S600 Series, designed to enable the accurate monitoring of 65nm and 45nm parametric test structures. Cascade Microtech's innovative Pyramid Plus manufacturing process ensures a substantially lower cost of ownership, while delivering superior signal integrity and faster settling time, compared to traditional probe technologies. The PDC50 is ideal for applications such as final process development, DC-only parametric volume production (in-line and end-of-line), and Wafer-Acceptance Testing (WAT).

PDC50 DC Parametric Pyramid Probe Cards
Features	PDC50
Guarded traces to probe tips with lowest leakage Excellent measurement fidelity with low leakage (1fA/V), fast settling time, and reduced cross talk One card for both Cu and Al pads probing Small-pad probing down to 30x30 um Low cost of ownership, superior signal integrity and fast settling time enabled by Pyramid Plus manufacturing technology	PDC50 Datasheet